ArNanoFab 100 Argon ion polishing instrument Application Cases
The section of shale after ion plane polishing reveals that the nano-scale pores on the sample surface are inorganic pores on the left and organic pores on the right. SEM image of petroleum geology.
SEM image of internal structure and material characteristics of mobile phone flexible screen after ion cutting, semiconductor field.
The cross-section of the battery material after ion cutting reveals its internal structure. The left picture showing the anode plate of the battery, the right picture showing the battery diaphragm, the SEM image, and the field of energy battery materials.
The left figure showing the internal structure of the chip after ion cutting, the right figure showing the internal structure of the chip after ion plane polishing, and the SEM image semiconductor chip field.
LED pad structure after plane polishing, SEM image, semiconductor optoelectronic field.
EBSD results of synthetic materials after low voltage plane polishing, EBSD image, new material field.